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design-for-test logic

См. также в других словарях:

  • Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… …   Wikipedia

  • Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… …   Wikipedia

  • Design closure — is the process by which a VLSI design is modified from its initial description to meet a growing list of design constraints and objectives. Every step in the IC design (such as static timing analysis, placement, routing, and so on) is already… …   Wikipedia

  • Design of experiments — In general usage, design of experiments (DOE) or experimental design is the design of any information gathering exercises where variation is present, whether under the full control of the experimenter or not. However, in statistics, these terms… …   Wikipedia

  • Test (student assessment) — A test or an examination (or exam ) is an assessment, often administered on paper or on the computer, intended to measure the test takers or respondents (often a student) knowledge, skills, aptitudes, or classification in many other topics (e.g …   Wikipedia

  • Electronic design automation — (EDA) is the category of tools for designing and producing electronic systems ranging from printed circuit boards (PCBs) to integrated circuits. This is sometimes referred to as ECAD (electronic computer aided design) or just CAD. (Printed… …   Wikipedia

  • Test-driven development — (TDD ) is a software development technique consisting of short iterations where new test cases covering the desired improvement or new functionality are written first, then the production code necessary to pass the tests is implemented, and… …   Wikipedia

  • Integrated circuit design — Layout view of a simple CMOS Operational Amplifier ( inputs are to the left and the compensation capacitor is to the right ). The metal layers are colored blue and green, the polysilicon is red and vias are crosses. Integrated circuit design, or… …   Wikipedia

  • Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… …   Wikipedia

  • Logic simulation — is the use of a computer program to simulate the operation of a digital circuit. Logic simulation is the primary tool used for verifying the logical correctness of a hardware design. In many cases logic simulation is the first activity performed… …   Wikipedia

  • Built-in self-test — A built in self test (BIST)mechanism within an integrated circuit (IC) is a function that verifies all or a portion of the internal functionality of the IC. For example, a BIST mechanism is provided in advanced fieldbus systems to verify… …   Wikipedia

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